DCG Systems

Products

DCG Systems' Suite of 32 nm-ready Solutions

Electrical Failure Analysis
Meridian-IV	TriVision	Meridian WaferScan
Parametric Fault Isolation for Dynamic Failure Analysis	Versatile Electrical Failure Analysis	Yield Analysis

Circuit Edit
OptiFIB-IV	P3X Cobra
Advanced Backside Circuit Edit	Precision Circuit Edit

Circuit Analysis
Ruby	EmiScope-III
Optical Probing for Design & Timing Analysis	Time-resolved Emission for Design & Timing Analysis

nanoInstruments
nProber	dProber	sProber
A complete SEM probing solution which integrates eight nanoprobes.	A door-mounted prober which integrates six probes into an existing SEM or FIB system.	A four-probe solution which may be installed in and removed from an existing SEM or FIB system.

Thermal Analysis
ELITE


Navigation and Data Analysis
NEXS Layout	NEXS SiliconGPS	NEXS Schematic

DCG Systems' supported Legacy Products
	IDS 5000, IDS 10000, IDS 1000plus Electron-beam probers produced by Schlumberger ATE

	IDS 2000, IDS 2500 Laser voltage probing systems produced by Schlumberger ATE and NPTest

	IDS P2X, IDS P3X, IDS P3X-II, P3X-III Focused-ion beam systems produced by Schlumberger ATE, NPTest and Credence

	EmiScope, EmiScope-II Time-resolved Emission systems produced by Optonics and Credence

	Hypervision BEAMS instruments Certain emission instruments produced by Hypervision are eligible for support. Please contact your local DCG Service representative.

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