Circuit Edit A suite of Circuit Edit tools and options.
OptiFIB-IV The DCG Systems OptiFIB-IV focused ion-beam (FIB) instrument offers a proven circuit edit solution for 45nm and beyond, providing advanced circuit edit capability with higher edit throughput and unparalleled edit success rates.
P3X-IV The DCG Systems P3X-IV focused ion-beam (FIB) instrument offers a proven front-side circuit edit solution for 45nm and beyond, providing advanced circuit edit capability with higher edit throughput and unparalleled edit success rates to significantly reduce time-to-market and time-to-yield for semiconductor devices.
NEXS provides CAD navigation capability for DCG's focused-ion systems. A net trace feature allows a net to be traced and expanded into its individual CAD layers for targeted highlighting and defining FIB edits. FIB edit plans can be defined with net traces, boxes and text, and saved in one step and reloaded later for use with repetitive edits. Optional NEXS Layout configurations read either GDS or Knights mask database formats.
