Electrical Failure Analysis A suite of Electrical Failure Analysis (EFA) tools and options.
Meridian-IV The DCG Systems Meridian-IV is a fully integrated, performance driven electrical failure analysis platform designed to facilitate the analysis of static and parametric defects in advanced 45 nm technology
TriVision The DCG Systems TriVision is a fully integrated electrical failure analysis platform providing industry-leading sensitivity for fault and defect localization. TriVision is the preferred choice for developers of advanced semiconductor devices who need a cost-effective, scalable platform designed to easily expand in step with future technology.
Meridian WaferScan Meridian WaferScan brings device analysis to an entirely new level with a comprehensive, high volume analytical approach to electrical fault localization. Whether your goal is to gather emission data or apply the latest dynamic laser stimulation techniques, Meridian WaferScan brings the power of wafer-based data acquisition to your lab. Meridian WaferScan significantly increases the value of your physical failure analysis by saving your wafers from being diced prematurely. A more efficient analysis results in a faster yield ramp.
NEXS provides CAD navigation for the physical device, and cross-maps emission locations to the CAD layout and circuit schematic. Optional NEXS Layout configurations read either GDS or Knights mask database formats.
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