Thermal Failure Analysis Enhanced Lock-in Thermal Emission solutions for semiconductors and solar cells
ELITE
Defective or underperforming semicondutor devices and solar cells often show an anomalous distribution of the local power dissipation, leading to local temperature increases. The ELITE utilizes Lock-in IR Thermography (LIT) to accurately and efficiently locate these areas.
NEXS provides CAD navigation capability for semiconductor thermal analysis. NEXS allows thermal locations to be mapped back to elements in the associated schematic. Optional NEXS Layout configurations read either GDS or Knights mask database formats.
