Laser Voltage Imaging (LVI), shows the physical locations of transistors that are active at a specific frequency. LVI can be tuned to frequencies to be traced, and may also be used to show exactly where to get the best signal strength for specific waveform measurements, even to the pixel where the "sweet spot" for probing is found.

The Laser Scanning Microscope (LSM) visually maps locations of transistors. By concentrating on a specific area of the DUT, one can scan for the dominant frequencies. LVI locates the transistors and thus maps circuits operating at those frequencies. LVI also enables signal tracing through circuitry, and even non-periodic signals can be monitored.

Continuous Wave Laser Voltage Probing (CW-LVP) acquires functional waveform data. Unlike high-bandwidth pulsed-laser LVP, such as that employed in the DCG Systems Ruby instrument, this fast LVP uses a Continuous Wave (CW) laser. The advantage of this approach is that the real-time sampling that CW-LVP employs provides higher efficiency in capturing multiple samples for each trigger from the stimulus, hence shortening the acquisition time.

The effective bandwidth of the measurement using CW-LVP is limited to approximately 7 GHz, which makes it suitable for quick functional analysis. For high bandwidth applications and timing analysis, one must use a traditional pulsed-laser LVP system such as the DCG Systems Ruby platform, yielding a system bandwidth in excess of 20 GHz.