When looking for "killer defects," don't place all your bets on a single chip...

With the stakes so high, the acquisition of meaningful statistical yield data is no game. Meridian WaferScan brings device analysis to an entirely new level with a comprehensive, high volume analytical approach to electrical fault localization. Whether your goal is the gathering of emission data or the application of the latest dynamic laser stimulation techniques, WaferScan brings the power of wafer-based data acquisition to your lab.

• Incorporates all Meridian-IV capabilities
• High resolution SIL imaging for package parts
• Rapid die-to-die indexing
• Dynamic fault coverage with high-speed ATE interface
• Fully compatible with NEXS Software Suite (& most popular 3rd party EDA applications)

"Invisible" faults:

• Parametric rather than physical
• Incapable of being traced to a specific defect
• May be t he result of lithography issues or process variations
• Impact device timing, power consumption, power dissipation and noise

Laser Voltage Imaging

Laser Voltage Imaging (LVI), shows the physical locations of transistors that are active at a specific frequency on the Meridian-IV.

CW Laser Voltage Probing

Continuous Wave Laser Voltage Probing (CW-LVP) acquires functional waveform data on the Meridian-IV.

NEXS Software for Electrical Failure Analysis