Products: DCG Systems' Suite of 45nm-ready Solutions
Yield Ramp |
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Meridian WaferScan
Backside Wafer-level Analysis |
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Electrical Failure Analysis |
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Meridian-IV
Parametric Fault Isolation for Dynamic Failure Analysis |
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TriVision
Versatile Electrical Failure Analysis |
Circuit Edit |
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OptiFIB-IV
Advanced Backside Circuit Edit |
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P3X-IV
Precision Circuit Edit |
Design Analysis |
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Ruby
Optical Probing for Design & Timing Analysis |
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EmiScope-III
Time-resolved Emission for Design & Timing Analysis |
Lock-in Thermography |
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ELITE
Lock-in Thermography for semiconductor and solar cell analysis |
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Navigation and Data Analysis |
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NEXS
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DCG Systems' supported Legacy Products
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IDS 5000, IDS 10000, IDS 1000plus
Electron-beam probers produced by Schlumberger ATE |
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IDS 2000, IDS 2500
Laser voltage probing systems produced by Schlumberger ATE and NPTest |
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IDS P2X, IDS P3X, IDS P3X-II, P3X-III
Focused-ion beam systems produced by Schlumberger ATE, NPTest and Credence |
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EmiScope, EmiScope-II
Time-resolved Emission systems produced by Optonics and Credence |
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Hypervision BEAMS instruments
Certain emission instruments produced by Hypervision are eligible for support. Please contact your local DCG Service representative. |
