Service Labs which feature DCG Systems' Solutions
North America
Advanced Circuit Engineers (ACE)
Location:San Jose, California, USA
Instruments:
- Circuit Modification: OptiFIB, P3X,
- Design Debug: IDS 10000plus (E-beam prober)
FIBICS
Location: Ottawa, Canada
Instruments:
- Circuit Modification: OptiFIB
FIB-X
Location: Dallas, Texas
Instruments:
- Circuit Modification: P3X and P2X
Europe
LFoundry FA Lab
Contact: bernard.picart@lfoundry.com
Location: France
- Circuit Modification: OptiFIB III with 12" wafer capability
- Debug Design: Emiscope (TRE, SIL)
- Electrical Failure Analysis: Meridian IV Waferscan (Wafer, LSM, InGaAs, SIL, LVI, CW-LVP), ELITE
Paper presented at ISTFA 2011: "Scan chain debug using Dynamic Lock-In Thermography"
ISTFA 2011, Proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011.
MASER Engineering
Location: Netherlands
Instruments:
- Circuit Modification: OptiFIB-IV
Article mentioning MASER's use of the OptiFIB-IV: "Failure analysis services" EuroAsia Semiconductor, vol. 30, no. 7, August 2008
Technical University, Berlin
Location: Berlin, Germany
Instruments:
- Circuit Modification: OptiFIB
DSTL
Contact: James McLeod jsmcleod@dstl.gov.uk
Location: UK
Instrument:
- Circuit Modification: P2X
- Design Debug: IDS 5000HX E-Beam prober
SiVenture
Contact: info@siventure.co
Location:Maidenhead, UK
Instrument:
- Circuit Modification: P3X
Thales/CNES
Location Toulouse, France
Instruments:
- Circuit Modification: OptiFIB and P2X
- Electrical Failure Analysis: Meridian (LSM)
Asia
HKSTP
Location: Hong Kong
Instruments:
- Circuit Modification: OptiFIB
- Design Debug: EmiScope (TRE, SIL)
- Electrical Failure Analysis: TriVision (LSM, InGaAs)
Hong Kong University of Science and Technology
Location: Hong Kong
Instruments:
- Circuit Modification: P3X
Spirox EVSD
Location Hsinchu, Taiwan
Instruments:
- Circuit Modification: OptiFIB
- Design Debug: Emiscope
- Electrical Failure Analysis: Meridian-IV (LSM, InGaAs)
Japan
SUN-S Col, Ltd.
Location: Japan
Instruments:
- Circuit Modification: P3X and P2X
- Electrical Failure Analysis: Meridian-IV (LSM, InGaAs, SIL)
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