Service Labs which feature DCG Systems' Solutions
North America
Advanced Circuit Engineers (ACE)
Location:San Jose, California, USA
Instruments:
- Circuit Modification: OptiFIB, P3X,
- Design Debug: IDS 10000plus (E-beam prober)
Analytical Solutions, Inc. (ASI)
Location: Albuquerque, New Mexico, USA
Instruments:
- Circuit Modification: P2X
- Design Debug: IDS E-beam
FIBICS
Location: Ottawa, Canada
Instruments:
- Circuit Modification: OptiFIB
FIB-X
Location: Dallas, Texas
Instruments:
- Circuit Modification: P3X and P2X
Europe
MASER Engineering
Location: Netherlands
Instruments:
- Circuit Modification: OptiFIB-IV
Article mentioning MASER's use of the OptiFIB-IV: "Failure analysis services" EuroAsia Semiconductor, vol. 30, no. 7, August 2008
Technical University, Berlin
Location: Berlin, Germany
Instruments:
- Circuit Modification: OptiFIB
DSTL
Contact: James McLeod jsmcleod@dstl.gov.uk
Location: UK
Instrument:
- Circuit Modification: P2X
- Design Debug: IDS 5000HX E-Beam prober
SiVenture
Contact: info@siventure.co
Location:Maidenhead, UK
Instrument:
- Circuit Modification: P3X
Thales/CNES
Location Toulouse, France
Instruments:
- Circuit Modification: OptiFIB and P2X
- Electrical Failure Analysis: Meridian (LSM)
Center for Microelectronics Provence-Alps-Riviera ( CIM PACA)
Location: France
Instruments:
- Design Debug: Emiscope (TRE, SIL) and IDS 10000 E-beam prober
- Electrical Failure Analysis: Meridian (Wafer, LSM, InGaAs)
Asia
HKSTP
Location: Hong Kong
Instruments:
- Circuit Modification: OptiFIB
- Design Debug: EmiScope (TRE, SIL)
- Electrical Failure Analysis: TriVision (LSM, InGaAs)
Hong Kong University of Science and Technology
Location: Hong Kong
Instruments:
- Circuit Modification: P3X
Spirox EVSD
Location Hsinchu, Taiwan
Instruments:
- Circuit Modification: OptiFIB
- Design Debug: Emiscope
- Electrical Failure Analysis: Meridian-IV (LSM, InGaAs)
Japan
SUN-S Col, Ltd.
Location: Japan
Instruments:
- Circuit Modification: P3X and P2X
- Electrical Failure Analysis: Meridian-IV (LSM, InGaAs, SIL)
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