When looking for "killer defects," don't place all your bets on a single chip...

With the stakes so high, the acquisition of meaningful statistical yield data is no game. Meridian WaferScan brings device analysis to an entirely new level with a comprehensive, high volume analytical approach to electrical fault localization. Whether your goal is the gathering of emission data or the application of the latest dynamic laser stimulation techniques, WaferScan brings the power of wafer-based data acquisition to your lab.

Meridian WaferScan significantly increases the value of your physical failure analysis

The rules of analysis are changing...are you prepared?

"Invisible" faults:

• Parametric rather than physical
• Incapable of being traced to a specific defect
• May be t he result of lithography issues or process variations
• Impact device timing, power consumption, power dissipation and noise

Features

• Incorporates all Meridian-IV capabilities
• High resolution SIL imaging for package parts
• Rapid die-to-die indexing
• Dynamic fault coverage with high-speed ATE interface
• Fully compatible with NEXS Software Suite (& most popular 3rd party EDA applications)